High Precision Thin Film Thickness Measurement Reflectometer – Enviro Testers

It is a compact desktop film thickness measurement system delivering high accuracy, stability, and NanoSense-grade analysis at excellent value.

SKU: ETEHPCMTG-193 Category:

Key Features

  • Highly flexible manual measurement operation
  • Standard spot size range: 0.8–1.5 mm
  • Upgradeable to a 0.2 mm spot size
  • Customizable portable carrying case for on-the-go film thickness analysis
  • Optional large-format sample stage available

Technical Specifications

Model Type ETEHPCMTG-193-A ETEHPCMTG-193 ETEHPCMTG-193-B
Wavelength Range 190 nm – 1100 nm 380 nm – 1050 nm 950 nm – 1700 nm
Thickness Measurement Range¹ 1 nm – 40 µm 15 nm – 80 µm 150 nm – 250 µm
Accuracy² 1 nm or 0.2% 2 nm or 0.2% 3 nm or 0.4%
Precision³ 0.02 nm 0.02 nm 0.1 nm
Stability⁴ 0.05 nm 0.05 nm 0.12 nm
Spot Size 1.5 mm
Measurement Speed < 1 s (Single Measurement)
Light Source Halogen + Deuterium Lamp Halogen Lamp Halogen Lamp
Sample Size Diameter from 1 mm to 300 mm or larger